You can find the following surface analytical methods in our high-end laboratories:

In addition to solids, liquids and lubricants can also be analysed. The semi-quantitative analysis allows the comparison of samples. The method is very surface sensitive and is suitable for the chemical characterization of interfaces.
TOF-SIMS
XPS
The combination of the EDX unit with a scanning electron microscope (SEM) for element analysis on a microscopic scale also allows element distribution images. Defect analyses or defects can be displayed.
SEM-EDX
Are you looking for analyses of the outermost atomic layer using LEIS? Learn more ...| tascon.eu
LEIS
Optical profilometry is used, among other things, to determine roughness, roughness measurements or crater depth determination, and surface topography.
Optical Profilometry
Other Methods of Surface Analysis